240 6.5 Scanning Probe Microscopy and Force Spectroscopy
could be cut to produce a sharp enough tip). Nonmetallic but electrically conducting carbon
nanotubes have also been utilized, which have some advantages of better manufacturing
reproducibility and mechanical stability. Electrical conduction at the tip is mediated through
the atom of the tip closest to the sample surface, and so the effective radius of curvature is one
to two orders of magnitude smaller than that for AFM tips.
No physical contact is made between tip and sample, and therefore there is a classically
forbidden energy gap across which electrons must quantum tunnel across for electrical con
duction to occur (Figure 6.8a). In the classical picture, if an electron particle of speed ν and
charge q has kinetic energy E of ~mν2/2, then it will not be able to travel to a region of space,
which involves crossing a potential energy barrier P of qV where V is the electrical potential
voltage difference if qV > mv2/2 since this implies an electron with negative kinetic energy in
the barrier itself, and so instead the electron is reflected back from the boundary.
However, in a quantum mechanics model the electron particle is also an electron
wave, which has a finite probability of tunneling through the potential barrier. This can
be demonstrated by solving Schrödinger’s wave equation in the barrier that results in a
nonperiodic evanescent wave solution whose transmission coefficient, T, for a rectangular
shaped barrier of width z, takes the form
(6.30)
T E
z
m
h V
E
( ) =
−
−
(
)
exp
2
2
The tunneling electron current IT depends on the tip–sample separation z and the effective
width wxy in the lateral xy plane of the sample over which tunneling can occur as
(6.31)
I
I
Az
w
T
xy
=
−
0
1 2
exp
/
where
I0 is the equivalent current at zero gap between the tip and the sample
A is a constant equal to (4π/h)(2m)1/2 where h is Plank’s constant and m the free elec
tron mass
The free electron depends upon the electrical potential energy gap between tip and sample,
and so A is sometimes written in non-SI units as 1.025 Å eV−1/2. The exponential dependence
of IT in terms of tip–sample distance makes it very difficult to measure the current
experimentally if the distance is greater than a few tenths of a nanometers from a weakly
conducting surface such as a biological sample.
FIGURE 6.8 Other scanning probe microscopies, (a) Scanning tunneling microscopy and
(b) scanning ion conductance microscopy.